Contact
:
+49 (0) 8554 94239-0
or
info@cable-tec.net
Language
Deutsch
English
|
login
Products Crimping line
Capability checks of tools
Monitoring of production
Pull test measurement
Complete micrograph labs
Modules for micrograph labs
Software
Piezo quartz sensors
Crimp applicators
Products Stamping line
Oil Spraying Systems
Optical sensors
Service
Expert advice
Calibration, maintenance, repair service
Inspection Services
Company
About
Quality and environment
News
Contact persons
Network
Career
Download
c-tec
Products Crimping line
Modules for micrograph labs
Cutting/Grinding Unit ML 3300
Device for cutting and grinding the crimp
Go to product
Cutting/Grinding Unit ML 3301
Cutting and grinding unit with metal saw blade integrated in an aluminum housing
Go to product
Fine cutting machine FC 4001
Fine cutting machine for large crimp connections
Go to product
Electronic fine polishing unit EFP 3.0
EFP 3.0 facilitates the fast and reliable polishing of the crimp surface
Go to product
Electronic fine polishing unit EFP 4.0
Fine polishing device for large crimp contacts from 10mm² on
Go to product
Optic station ML 3204
Measuring microscope with 4x zoom to conduct crimp tests after the polishing
Go to product
Optic station ML 3212
Excellent measuring microscope with 12x zoom for the cross section analysis after the polishing
Go to product
Optic station OP 4001
Measuring microscope for analysis of large diameters after the polishing process
Go to product
Optic station OP 4003
Dual optic station OP 4003 with 12x and 6x zoom for a broad variety of cross sections
Go to product